UNI-T USG3000M-PG Narrow Pulse Generator Option

Overview

The USG3000M-PG is a specialized narrow pulse generator option for the USG3000M series RF signal generators. This advanced option enhances your USG3000M generator with high-precision, narrow pulse generation capabilities, enabling the creation of extremely short RF pulses essential for automotive radar testing, high-speed digital communications, and advanced research applications.

Key Features

• Ultra-Narrow Pulse Width: Generate pulses as narrow as 20 ns with 10 ns resolution
• Precise Timing Control: Fine adjustment of pulse parameters with 10 ns precision
• Extended Pulse Period Range: Create pulse patterns from 40 ns to 42 seconds
• High-Resolution Delay Control: Set pulse delays with 10 ns resolution
• Flexible Triggering Options: Free-running or triggered operation for versatile test setups

Technical Specifications

Application Examples

Automotive Millimeter-Wave Radar Testing

The USG3000M-PG is ideal for testing automotive radar systems:

• Generate precise timing pulses for frequency-modulated continuous wave (FMCW) radar testing
• Simulate target returns with specific pulse characteristics
• Test radar receiver detection thresholds with precisely controlled pulse widths
• Verify radar signal processing performance with complex pulse sequences

High-Speed Digital Communications

Evaluate high-data-rate communications systems with accurate narrow pulse generation:

• Test pulse recovery in receiver circuits
• Evaluate timing margins in digital communications systems
• Characterize jitter performance with precisely controlled pulse timing
• Simulate interference scenarios with narrow pulse bursts

Advanced Research and Development

Support cutting-edge research with high-precision pulse capabilities:

• Create timing signals for quantum computing experiments
• Generate synchronization pulses for multi-instrument test setups
• Develop and test pulse-based sensing technologies
• Simulate electromagnetic pulse (EMP) effects at reduced power levels

Semiconductor Device Testing

Characterize high-speed semiconductor devices:

• Measure switching characteristics with precise pulse timing
• Evaluate recovery time of RF components
• Test high-speed digital circuits with controlled pulse widths
• Characterize on/off transients in RF transistors

Integration Requirements

The USG3000M-PG option requires the USG3000M-PM pulse modulation option to be installed first. Together, these options provide comprehensive pulse generation capabilities from standard to ultra-narrow pulse widths.

The USG3000M-PG option can be installed on any model in the USG3000M series:

• USG3045M (9 kHz to 4.5 GHz)
• USG3045M-P (9 kHz to 4.5 GHz with mechanical attenuator)
• USG3065M (9 kHz to 6.5 GHz)
• USG3065M-P (9 kHz to 6.5 GHz with mechanical attenuator)

Ordering Information

Both options should be specified when ordering for complete narrow pulse generation capabilities.

Installation

The USG3000M-PG option can be installed at the time of purchase or added later as an upgrade. For existing units, the option is enabled through a license file installation procedure that can be performed by the user.