Overview

The UNI-T USG3045M RF signal generator delivers exceptional performance with frequencies from 9 kHz to 4.5 GHz, making it ideal for wireless communications, component testing, and research applications. Featuring high signal purity, precise level control, and comprehensive modulation capabilities, this instrument provides the reliability and accuracy that RF professionals demand in today's challenging testing environments.

Engineered for professional testing needs, the USG3045M combines advanced RF signal generation capabilities with an intuitive user interface and versatile connectivity options. The exceptional signal quality with low phase noise (<-122 dBc/Hz @ 1 GHz, 20 kHz offset) ensures accurate measurements for critical applications. Whether you're working in wireless communications, educational environments, production testing, or RF development, the USG3045M provides the measurement accuracy, modulation capabilities, and ease of operation needed to solve your most challenging RF testing requirements.

The USG3045M delivers precision RF signal generation with exceptional purity across its full frequency range. With phase noise performance of <-122 dBc/Hz at 1 GHz (20 kHz offset), the signal generator provides the clean signal sources necessary for accurate component characterization and receiver testing. The high-performance RF architecture ensures superior harmonic suppression (≤ -50 dBc from 10 MHz to 1 GHz), enabling confident measurements without interference from unwanted signal components.

The outstanding frequency resolution of 0.001 Hz allows for ultra-precise frequency setting, essential for applications requiring exact signal frequencies. Combined with amplitude accuracy of ≤ 0.7 dB (typical), the instrument ensures your test signals meet exact specifications. This exceptional performance makes the USG3045M ideal for applications ranging from cellular component testing to aerospace and defense verification, where signal quality directly impacts measurement validity.

The USG3045M provides versatile modulation capabilities essential for thorough communications system testing. Standard analog modulation includes AM with depths up to 99%, FM with deviation up to 10 MHz, and phase modulation up to 5 radians. The flexible modulation sources allow for internal, external, or combined operation, adapting to diverse testing scenarios. Each modulation type features precise control of parameters, enabling accurate simulation of real-world signal conditions.

For applications requiring pulsed RF signals, the optional USG3000M-PM pulse modulation capability delivers outstanding on-off ratios up to 80 dB with fast rise/fall times below 20 ns. The pulse modulation can operate in various modes including free-running, triggered, gated, and customized pulse train patterns. When combined with the optional USG3000M-PG narrow pulse generator, the system can generate pulses as narrow as 20 ns with 10 ns resolution, perfect for radar system testing and pulse characterization applications.

USG3000M series features a stable clock source and offers optional pulse modulation and a narrow pulse generator. The USG3000M-PG option delivers a minimum pulse width of 20 ns with a resolution of 10 ns, meeting the requirements of automotive millimeter-wave radar systems and advanced timing applications. The pulse generator provides exceptional timing precision and stability across multiple operating modes.

With the optional pulse modulation package, you can generate customized pulse trains with precisely controlled timing parameters. Multiple pulse modes are supported, including Free-Run, Square, External Triggered, Adjustable Doublet, External Trigger Doublet, Gated, External Pulse, and Pulse Train. The outstanding on-off ratio of ≥ 80 dB ensures clear signal transitions with minimal bleed-through, while fast rise/fall times below 20 ns enable accurate simulation of high-speed pulsed systems. These capabilities are essential for radar system testing, pulse characterization, and advanced communications applications.

The USG3045M features comprehensive sweep capabilities that simplify component characterization and system response testing. The instrument supports frequency, amplitude, and list sweep modes with customizable step sizes and dwell times. Engineers can perform frequency sweeps across the full 9 kHz to 4.5 GHz range with linear or logarithmic step patterns, enabling efficient measurement of frequency-dependent parameters like filter responses or amplifier gain flatness.

For more complex testing requirements, the list sweep mode allows creation of custom frequency-amplitude point sequences, ideal for focused testing at specific frequencies of interest. Sweep operation can be triggered via multiple methods including free-running, external trigger, manual key press, or computer command, providing flexibility for both manual testing and automated sequences. These advanced sweep functions streamline the characterization process and reduce overall test time compared to point-by-point manual measurements.

The USG3045M features a 5-inch capacitive multi-touch screen with an intuitive user interface that accelerates test setup and enhances productivity. The flat design with clear parameter organization allows for quick access to commonly used functions, while the logical menu structure ensures even complex operations can be performed with minimal keystrokes. The touch interface supports gestures for common operations, reducing setup time and allowing engineers to focus on test results rather than instrument configuration.

Visual feedback is provided through clear waveform displays for both output and modulating signals, enabling immediate verification of signal characteristics. The interface allows seamless switching between time-domain and frequency-domain views, providing comprehensive signal visualization. Numerical parameters are displayed with high visibility and logical grouping, ensuring settings are easily verifiable at a glance. This thoughtful interface design reduces learning curves and improves testing efficiency in both research and production environments.

The USG3045M includes a built-in 50 MHz function/arbitrary waveform generator that extends the instrument's versatility beyond RF applications. This integrated LF generator produces high-quality sine waves up to 50 MHz, square and pulse waveforms up to 15 MHz, and triangular waves up to 3 MHz. With output amplitude adjustable from 1 mVpp to 2 Vpp and DC offset control, it provides the signal flexibility needed for various testing applications without requiring additional equipment.

The function generator includes advanced capabilities such as linear and logarithmic sweep functions and comprehensive modulation options including AM, FM, and pulse modulation. For digital communications testing, it supports ASK, FSK, PSK, and QAM modulation with various digital patterns. This integration delivers significant value by combining two essential instruments in one compact unit, saving both bench space and equipment costs while maintaining signal generation quality.

The optional USG3000M-PK power meter option transforms the USG3045M into a comprehensive RF test solution by adding accurate power measurement capabilities. Connected through the front panel USB port, this accessory enables precise RF power measurements, particularly valuable for calibrating output power levels and verifying signal integrity at the device under test. The power measurement system allows direct verification of actual received power, eliminating uncertainty in test setups.

A key capability of the power meter option is the line loss calibration function, which automatically compensates for cable and fixture losses in the test path. This ensures that the power level reaching the device under test matches the specified value, improving measurement accuracy and test consistency. By combining signal generation and power measurement in a single coordinated system, the power meter option streamlines test procedures and reduces the need for additional test equipment, providing significant value for RF development and production test applications.