Overview

The UNI-T UTG4104X delivers four independent, equal-performance channels of arbitrary waveform generation up to 100 MHz—with 2.5 GSa/s sampling, 16-bit vertical resolution, and 128 Mpts waveform memory—at a price where competitors offer only two channels. Designed for hardware engineers, university labs, and wireless developers who need professional multi-channel signal generation without premium pricing, the UTG4104X provides 15 modulation types, built-in digital protocol output (SPI, I²C, UART), and advanced functions including multi-pulse, multi-tone, sequence, and IQ signal generation that typically require instruments costing two to three times more.

You need a waveform generator that keeps up with your real-world test scenarios—simulating clock, data, trigger, and stimulus signals simultaneously across four channels. The UTG4104X eliminates the workaround of daisy-chaining two-channel instruments, saves bench space, and gives every channel the same full-performance output. Whether you're validating embedded systems, characterizing filters, testing communication protocols, or equipping a teaching lab, the UTG4104X delivers the channel count, modulation depth, and signal fidelity your applications demand—backed by an exclusive 3+2 year warranty (5 years with registration) and SCPI remote control for automated test integration.

Most waveform generators in this price range give you two channels—and often, the second channel has reduced performance compared to the first. The UTG4104X delivers four fully independent channels, each with identical specifications. Every channel outputs the same 100 MHz sine waves, the same 50 MHz square/pulse signals, the same full suite of 15 modulation types, and the same 20 Vpp maximum amplitude.

Why four channels matter for your workflow: Real-world circuits don't operate on a single signal. You're testing a mixed-signal board that needs a clock on CH1, serial data on CH2, an analog stimulus on CH3, and a trigger reference on CH4—simultaneously. With a two-channel instrument, you're either swapping cables between test runs or buying a second generator (doubling your cost and bench footprint). The UTG4104X handles it in one box.

Channel coupling and merge functions let you combine channels for complex stimulus patterns. Synchronization output maps CH1 sync to CH3 and CH2 sync to CH4, providing precise timing references when you need them. Each channel supports independent or simultaneous internal/external modulation and triggering—so four channels truly means four independent signal sources under your control.

Vertical resolution determines the smallest amplitude step your generator can produce. The UTG4104X's 16-bit DAC provides 65,536 discrete amplitude levels—4× more steps than a 14-bit instrument's 16,384 levels. This translates directly to lower quantization noise, smoother waveform transitions, and more accurate reproduction of complex arbitrary waveforms.

Where you'll notice the difference: When generating low-amplitude signals (millivolt range), 14-bit generators produce visible staircase artifacts. At 16-bit resolution, those steps are 4× smaller, producing cleaner signals that don't introduce measurement artifacts into your DUT. For arbitrary waveforms with fine amplitude detail—captured sensor signals, modulated envelopes, or custom test patterns—the additional resolution preserves waveform fidelity that lower-resolution instruments lose.

Combined with -130 dBc/Hz typical sine wave phase noise at 10 kHz offset, the UTG4104X produces output signals clean enough for demanding analog measurements without the generator itself becoming the noise-limiting factor in your test setup.

The UTG4104X includes a comprehensive modulation engine covering analog modulation (AM, FM, PM, DSB-AM, PWM, SUM), digital keying (ASK, FSK, 3FSK, 4FSK, PSK, BPSK, QPSK, OSK), and quadrature amplitude modulation (QAM). Each channel supports independent modulation—you can run AM on CH1, FSK on CH2, and QPSK on CH3 simultaneously.

What this means in practice: A wireless product engineer testing a Bluetooth module uses FSK modulation to generate stimulus signals. A communications engineer verifying a demodulator needs BPSK and QPSK test patterns. A power supply designer uses PWM to simulate controller outputs. An audio engineer needs AM for broadcast testing. Instead of configuring custom arbitrary waveforms (or buying a dedicated modulation source), you select the modulation type, set the parameters, and start testing. The modulation engine handles the math in real time.

Both internal and external modulation sources are supported on every channel, with internal modulation waveforms selectable from sine, square, ramp, arbitrary, or noise. External modulation accepts signals through the rear-panel modulation input for real-world stimulus scenarios.

The UTG4104X generates configurable multi-pulse trains of 2 to 30 pulses with independently adjustable width, gap, and edge timing for each pulse. Rise and fall times are adjustable down to less than 2 ns. This eliminates the tedious process of constructing complex pulse patterns in arbitrary waveform software—you define the pulse parameters directly on the instrument and output immediately.

Practical applications: Power electronics engineers use multi-pulse to simulate gate drive fault sequences and test protection circuit response times. Digital designers create multi-pulse patterns to validate setup/hold timing on interfaces. Automotive engineers simulate sensor pulse trains with specific timing signatures. Medical device engineers generate stimulus pulse sequences for transducer testing.

The multi-pulse function works alongside burst mode (N-cycle, gate, and infinite) and frequency sweep (linear, logarithmic, list frequency, and stepping), giving you flexible triggering and timing control for virtually any pulse-based test scenario.

Multi-tone output generates multiple simultaneous frequency components with configurable start frequency, tone spacing, and tone count. This is essential for two key applications: intermodulation distortion (IMD) testing of amplifiers and receivers, and multi-frequency stimulus for audio and vibration analysis.

For amplifier testing: Feed a multi-tone signal into a power amplifier or receiver front-end to measure third-order intermodulation products and characterize linearity under realistic multi-carrier conditions. Without built-in multi-tone, you'd need to combine outputs from multiple generators through external combiner networks—adding cost, complexity, and potential measurement uncertainty.

For audio and sensor testing: Generate multi-frequency test stimuli to characterize frequency response, crosstalk, and dynamic range across the band simultaneously, rather than sweeping one frequency at a time.

Sequence mode lets you chain multiple waveform segments into a programmable playback sequence with configurable sampling rate, filter mode, timing, and trigger behavior. This turns the UTG4104X into a scenario-based stimulus generator—creating time-varying test signals that simulate real-world operating conditions your DUT will encounter.

Dynamic test scenarios: Simulate a power-up sequence that ramps voltage, holds steady-state, injects a transient, and then ramps down—all as a single triggered sequence. Create a communication protocol test pattern that cycles through different modulation states. Build an automotive sensor simulation that changes output based on a predefined profile. Sequence mode handles these workflows that would otherwise require manual intervention or complex external triggering between separate waveform outputs.

The sequence engine supports rising-edge triggering with zero-order hold filtering, enabling precise timing control between segments for reproducible, automated test procedures.

Real-world signals don't arrive pristine—they're degraded by noise from power supplies, adjacent circuits, transmission paths, and environmental interference. The UTG4104X's one-key SNR function adds calibrated Gaussian noise to any output signal with adjustable signal-to-noise ratio, letting you test how your circuit performs under realistic noise conditions without external noise generators or manual signal combining.

Noise immunity testing: Verify that a sensor interface correctly reads signals at the specified SNR margin. Test a comparator's false triggering threshold by degrading its input signal progressively. Validate that a communication receiver maintains acceptable bit error rates as noise increases.

BER characterization: Sweep the SNR from high (clean) to low (noisy) and measure your receiver's bit error rate at each level to map the complete BER vs. SNR curve—a fundamental measurement for any digital communication system. The adjustable noise bandwidth ensures the noise profile matches your application's actual operating conditions.

The UTG4104X generates configurable SPI, I²C, and UART (TTL) protocol signals directly—no external protocol analyzer or pattern generator required. Configure clock frequency (up to 50 MHz for SPI), data format (hexadecimal or character), transmission mode (auto or manual), and timing interval, then output protocol-compliant signals from the front-panel channels.

Embedded development workflow: You're debugging an SPI sensor interface and need to verify your microcontroller handles specific data sequences correctly. Instead of writing firmware on a second MCU to generate test data, configure the UTG4104X to output the exact SPI transaction—clock, MOSI data, and chip select—on three channels simultaneously. Change data values on the touchscreen and retest immediately.

For I²C development, generate start/stop conditions, address bytes, and data with proper acknowledgment timing. For UART testing, output serial data at configurable baud rates to validate receiver parsing without needing a second system sending data. The protocol generator operates in auto mode (continuous transmission at set intervals) or manual mode (single transmission per button press) for both automated and interactive testing.

The UTG4104X supports four sweep modes—linear, logarithmic, list frequency, and stepping—for comprehensive frequency response characterization. Linear sweep moves through frequencies at constant rate for uniform analysis. Logarithmic sweep provides equal time per decade, matching how frequency response is typically plotted. List frequency sweep hits specific discrete frequencies you define. Stepping sweep increments through frequencies in fixed steps with configurable dwell time.

Filter characterization: Sweep a bandpass filter's input from below the passband through and above it to map the complete frequency response, identifying -3 dB points, rolloff rate, and out-of-band rejection. Logarithmic sweep gives you even coverage across decades for Bode plot analysis.

Resonance testing: Sweep through a mechanical or electrical resonant system's expected frequency range to locate resonance peaks and characterize Q factor. The stepping mode lets you dwell at each frequency long enough for the system to reach steady state before moving to the next measurement point.

All sweep modes support internal, external, and manual triggering with configurable trigger output, integrating smoothly into automated test setups.

The UTG4104X generates baseband I (in-phase) and Q (quadrature) signals with configurable sampling rate, center frequency, gain balance, phase adjustment, and independent I/Q DC offset. This provides the baseband modulation source needed for wireless transmitter and receiver development without requiring a dedicated vector signal generator.

How IQ generation fits your wireless workflow: Connect the I and Q outputs to an external upconverter or IQ modulator to create modulated RF test signals at your target carrier frequency. Adjust gain balance and phase angle to characterize IQ imbalance effects on your receiver. Use the independent DC offset controls to test receiver performance under carrier leakage conditions.

Combined with the 15 modulation types (including QAM, BPSK, and QPSK), the UTG4104X provides a capable and affordable baseband signal source for wireless development, education, and prototyping—particularly for IoT, Bluetooth, and sub-GHz protocol work where 100 MHz baseband bandwidth is more than sufficient.